![](/img/cover-not-exists.png)
[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Relationship between AC stress and DC stress on tunnel oxides
Zous, N.K., Chen, Y.J., Chin, C.Y., Tsai, W.J., Lu, T.C., Chen, M.S., Lu, W.P., Tahui Wang,, Pan, S.C., Ku, J., Chih-Yuan Lu,Year:
2004
Language:
english
DOI:
10.1109/ipfa.2004.1345563
File:
PDF, 192 KB
english, 2004