[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Limits of bias based assist methods in nano-scale 6T SRAM
Mann, Randy W., Nalam, Satyanand, Wang, Jiajing, Calhoun, Benton H.Year:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450413
File:
PDF, 397 KB
english, 2010