[IEEE 56th Annual Device Research Conference Digest - Charlottesville, VA, USA (22-24 June 1998)] 56th Annual Device Research Conference Digest (Cat. No.98TH8373) - Static and dynamic characterization of large-area high-current-density SiC Schottky diodes
Dolny, G.M., Morisette, D.T., Shenoy, P.M., Zafrani, M., Gladish, J., Woodall, J.M., Cooper, J.A., Melloch, M.R.Year:
1998
DOI:
10.1109/drc.1998.731131
File:
PDF, 444 KB
1998