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[IEEE 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Monterey, CA (2008.10.13-2008.10.15)] 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Geometry scaling issues originated by extrinsic stress in SiGe HBTs
Malladi, Ramana, Slinkman, Jim A., Joseph, AlvinYear:
2008
Language:
english
DOI:
10.1109/bipol.2008.4662733
File:
PDF, 1.58 MB
english, 2008