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[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - Performance enhancement schemes featuring lattice mismatched S/D stressors concurrently realized on CMOS platform: e-SiGeSn S/D for pFETs by Sn+ implant and SiC S/D for nFETs by C+ implant
Wang, Grace Huiqi, Eng-Huat Toh,, Xincai Wang,, Seng, Debbie Hwee Leng, Tripathy, Sudhinrajan, Osipowicz, Thomas, Tau Kuei Chan,, Samudra, Ganesh, Yee-Chia Yeo,Year:
2008
Language:
english
DOI:
10.1109/vlsit.2008.4588620
File:
PDF, 1.63 MB
english, 2008