[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Iterative methods for reluctance based PEEC models
Zitzmann, M.L., Clees, T., Weigel, R.Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.214874
File:
PDF, 187 KB
english, 2006