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[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Iterative methods for reluctance based PEEC models

Zitzmann, M.L., Clees, T., Weigel, R.
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Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.214874
File:
PDF, 187 KB
english, 2006
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