Bowtie limited diffraction beams for low-sidelobe and large...

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control 1995 / 11 Vol. 42; Iss. 6

Bowtie limited diffraction beams for low-sidelobe and large depth of field imaging

Jian-Yu Lu,
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
DOI:
10.1109/58.476549
Date:
November, 1995
File:
PDF, 1.44 MB
english, 1995
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