[IEEE International Symposium on Electromagnetic Compatibility - Boston, MA, USA (18-22 Aug. 2003)] 2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) - Parametric macromodels of drivers for SSN simulations
Stievano, I.S., Canavero, F.G., Chen, Z., Katopis, G., Maio, I.A.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/isemc.2003.1236674
File:
PDF, 396 KB
english, 2003