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[IEEE 2013 26th International Vacuum Nanoelectronics Conference (IVNC) - Roanoke, VA, USA (2013.07.8-2013.07.12)] 2013 26th International Vacuum Nanoelectronics Conference (IVNC) - Electron beam collimation with a 40,000 tip double-gate metal field emitter array and in-situ control of nanotip sharpness distribution
Helfenstein, P., Guzenko, V. A., Fink, H.-W., Tsujino, S.Year:
2013
Language:
english
DOI:
10.1109/ivnc.2013.6624747
File:
PDF, 411 KB
english, 2013