Three-dimensional effects in dynamically triggered CMOS latchup
Fiegna, C., Selmi, L., Sangiorgi, E., Ricco, B.Volume:
36
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/16.34230
Date:
January, 1989
File:
PDF, 798 KB
english, 1989