[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - The rules of the Rue Morgue: a decade later
Mura, G., Vanzi, M., Cassanelli, G., Fantini, F.Year:
2006
Language:
english
DOI:
10.1109/ipfa.2006.251000
File:
PDF, 2.09 MB
english, 2006