HEMT degradation in hydrogen gas

IEEE Electron Device Letters 1994 / 05 Vol. 15; Iss. 5

HEMT degradation in hydrogen gas

Chao, P.C., Kao, M.Y., Nordheden, K., Swanson, A.W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.291603
Date:
May, 1994
File:
PDF, 330 KB
english, 1994
Conversion to is in progress
Conversion to is failed