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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits
Semião, Jorge, Freijedo, Judit, Rodríguez-Andina, Juan Jose, Vargas, Fabian, Santos, Marcelino, Teixeira, Isabel, Teixeira, João PauloYear:
2008
Language:
english
DOI:
10.1109/iolts.2008.51
File:
PDF, 573 KB
english, 2008