[IEEE Comput. Soc 16th IEEE VLSI Test Symposium - Monterey, CA, USA (26-30 April 1998)] Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231) - A multi-mode scannable memory element for high test application efficiency and delay testing
Sogomonyan, E.S., Singh, A.D., Goessel, M.Year:
1998
Language:
english
DOI:
10.1109/vtest.1998.670886
File:
PDF, 46 KB
english, 1998