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[IEEE 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (Feb 12-16 2006)] 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop - A New Programming Disturbance Phenomenon in NAND Flash Memory By Source/Drain Hot-Electrons Generated By GIDL Current
Jae-Duk Lee,, Chi-Kyung Lee,, Myung-Won Lee,, Han-Soo Kim,, Kyu-Charn Park,, Won-Seong Lee,Year:
2006
Language:
english
DOI:
10.1109/.2006.1629481
File:
PDF, 264 KB
english, 2006