[IEEE Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2007.03.18-2007.03.22)] Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium - A Junction Temperature Reduction Technique for a Microprocessor Considering Temperature Coupled Leakage Power
Yoo, Jaewook, Choi, Kiwon, Kang, SayoonYear:
2007
Language:
english
DOI:
10.1109/stherm.2007.352409
File:
PDF, 326 KB
english, 2007