[IEEE Second Workshop on Mutation Analysis (Mutation 2006 -...

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[IEEE Second Workshop on Mutation Analysis (Mutation 2006 - ISSRE Workshops 2006) - Raleigh, NC, USA (2006.11.7-2006.11.10)] Second Workshop on Mutation Analysis (Mutation 2006 - ISSRE Workshops 2006) - Mutation Testing implements Grammar-Based Testing

Offutt, Jeff, Ammann, Paul, Liu, Lisa (Ling)
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Year:
2006
Language:
english
DOI:
10.1109/mutation.2006.11
File:
PDF, 261 KB
english, 2006
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