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[IEEE 2007 IEEE International High Level Design Validation and Test Workshop - Irvine, CA, USA (2007.11.7-2007.11.9)] 2007 IEEE International High Level Design Validation and Test Workshop - Automatic generation of functional coverage models from CTL
Verma, Shireesh, Harris, Ian G., Ramineni, KiranYear:
2007
Language:
english
DOI:
10.1109/hldvt.2007.4392806
File:
PDF, 322 KB
english, 2007