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[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors
Ballan, O., Bernardi, P., Yazdani, B., Sanchez, E.Year:
2013
DOI:
10.1109/iolts.2013.6604055
File:
PDF, 845 KB
2013