[IEEE 19th International Symposium on Power Semiconductor Devices and IC's - Jeju, Korea (2007.05.27-2007.05.31)] Proceedings of the 19th International Symposium on Power Semiconductor Devices and IC's - Long Term Stability and Drift Phenomena of different Trench IGBT Structures under Repetitive Switching Tests
Laska, T., Hille, F., Pfirsch, F., Jereb, R., Bassler, M.Year:
2007
Language:
english
DOI:
10.1109/ispsd.2007.4294917
File:
PDF, 2.40 MB
english, 2007