[IEEE 1997 IEEE International SOI Conference Proceedings - Fish Camp, CA, USA (6-9 Oct. 1997)] 1997 IEEE International SOI Conference Proceedings - Characterization of interface traps in SOI material
Vanheusden, K., Warren, W.L., Shedd, W.M., Pugh, R.D., Fleetwood, D.M., Schwank, J.R., Devine, R.A.B.Year:
1997
Language:
english
DOI:
10.1109/soi.1997.634934
File:
PDF, 198 KB
english, 1997