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[IEEE 2010 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Wavelet Analysis and Pattern Recognition - Fracture identification of X-ray image

Liang, Jian, Pan, Bao-Chang, Huang, Yong-Hui, Fan, Xiao-Yan
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Year:
2010
Language:
english
DOI:
10.1109/icwapr.2010.5576438
File:
PDF, 170 KB
english, 2010
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