[IEEE 2010 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Wavelet Analysis and Pattern Recognition - Fracture identification of X-ray image
Liang, Jian, Pan, Bao-Chang, Huang, Yong-Hui, Fan, Xiao-YanYear:
2010
Language:
english
DOI:
10.1109/icwapr.2010.5576438
File:
PDF, 170 KB
english, 2010