![](/img/cover-not-exists.png)
[IEEE 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Lubeck, Germany (2007.08.29-2007.08.31)] 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools (DSD 2007) - Hierarchical Identification of Untestable Faults in Sequential Circuits
Raik, Jaan, Ubar, Raimund, Krivenko, Anna, Kruus, MargusYear:
2007
Language:
english
DOI:
10.1109/dsd.2007.4341539
File:
PDF, 108 KB
english, 2007