Relation Between Low-Frequency Noise and Subgap Density of...

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IEEE Electron Device Letters 2010 / 11

Relation Between Low-Frequency Noise and Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Kim, Sungchul, Jeon, Yongwoo, Lee, Je-Hun, Ahn, Byung Du, Park, Sei Yong, Park, Jun-Hyun, Kim, Joo Han, Park, Jaewoo, Kim, Dong Myong, Kim, Dae Hwan
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Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2061216
Date:
November, 2010
File:
PDF, 441 KB
english, 2010
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