[IEEE 2011 IEEE International Integrated Reliability...

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[IEEE 2011 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2011.10.16-2011.10.20)] 2011 IEEE International Integrated Reliability Workshop Final Report - A new degradation mechanism of gate oxide reliability due to "extrinsic" responses of Qbd along rough "bird's-beak" frontline

Sheng, Lieyi, Gerlach, Jeff, Glines, Eddie
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Year:
2011
Language:
english
DOI:
10.1109/iirw.2011.6142598
File:
PDF, 611 KB
english, 2011
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