[IEEE 2009 IEEE International SOI Conference - Foster City, CA, USA (2009.10.5-2009.10.8)] 2009 IEEE International SOI Conference - Effect of source/drain asymmetry on the performance of Z-RAM® devices
Mohapatra, N. R., vanBentum, R., Pruefer, E., Maszara, W. P., Caillat, C., Chalupa, Z., Johnson, Z., Fisch, D.Year:
2009
Language:
english
DOI:
10.1109/soi.2009.5318778
File:
PDF, 459 KB
english, 2009