[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - Test Propagation Through Modules and Circuits
Murray, B.T., Hayes, J.P.Year:
1991
Language:
english
DOI:
10.1109/test.1991.519740
File:
PDF, 836 KB
english, 1991