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[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Convolutional Compaction-Driven Diagnosis of Scan Failures
Mrugalski, G., Pogiel, A., Rajski, J., Tyszer, J., Chen Wang,Year:
2005
Language:
english
DOI:
10.1109/ets.2005.11
File:
PDF, 131 KB
english, 2005