![](/img/cover-not-exists.png)
EPR based distance measurement in Cu-porphyrin–DNA
Nguyen, ThaoNguyen, Håkansson, Pär, Edge, Ruth, Collison, David, Goodman, Bernard A., Burns, Jonathan R., Stulz, EugenVolume:
38
Language:
english
Journal:
New J. Chem.
DOI:
10.1039/c4nj00673a
Date:
August, 2014
File:
PDF, 2.01 MB
english, 2014