[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Statistical analysis of induced ground voltage using the TLM+UT method
Pereira, Joao B. J., de Menezes, Leonardo R.A.X., Borges, Geovany A.Year:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652014
File:
PDF, 125 KB
english, 2008