High resolution X-ray imaging using amorphous silicon...

IEEE Transactions on Nuclear Science 1999 / 6 Vol. 46; Iss. 3

High resolution X-ray imaging using amorphous silicon flat-panel arrays

Rahn, J.T., Lemmi, F., Lu, J.P., Mei, P., Apte, R.B., Street, R.A., Lujan, R., Weisfield, R.L., Heanue, J.A.
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Volume:
46
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.775562
Date:
June, 1999
File:
PDF, 973 KB
english, 1999
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