Modeling the partition of noise from the gate-tunneling current in MOSFETs
Ranuarez, J.C., Deen, M.J., Chih-Hung Chen,Volume:
26
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2005.851813
Date:
August, 2005
File:
PDF, 129 KB
english, 2005