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[IEEE 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Berlin, Germany (2009.05.10-2009.05.12)] 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Yield enhancement and excursions prevention using fault detection and classification methods and product test data
Ansquer, Helene, Balsan, Christophe, Moreaud, Nathanael, Deprost, DominiqueYear:
2009
Language:
english
DOI:
10.1109/asmc.2009.5155963
File:
PDF, 250 KB
english, 2009