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[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Strained-silicon MOSFETs of low leakage current and high breakdown voltage for analog applications
Sugii, N., Kondo, M., Miyamoto, M., Hoshino, Y., Hatori, M., Hirasawa, W., Kimura, Y., Kimura, S., Kondo, Y., Yoshida, I.Year:
2005
Language:
english
DOI:
10.1109/.2005.1469209
File:
PDF, 382 KB
english, 2005