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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Stress grading materials: a discussion on lumped elements circuits validity
Rivenc, J.P., Bidan, P., Lebey, T.Year:
1998
Language:
english
DOI:
10.1109/icsd.1998.709339
File:
PDF, 425 KB
english, 1998