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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Novel ESD protection structure with embedded SCR LDMOS for smart power technology
Jian-Hsing Lee,, Shih, J.R., Tang, C.S., Liu, K.C., Wu, Y.H., Shiue, R.Y., Ong, T.C., Peng, Y.K., Yue, J.T.Year:
2002
Language:
english
DOI:
10.1109/relphy.2002.996629
File:
PDF, 374 KB
english, 2002