[IEEE 2014 30th Semiconductor Thermal Measurement &...

  • Main
  • [IEEE 2014 30th Semiconductor Thermal...

[IEEE 2014 30th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2014.3.9-2014.3.13)] 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - High thermal conductivity underfill for the thermal management of three-dimensional (3D) chip stacks

Matsumoto, Keiji, Mori, Hiroyuki, Orii, Yasumitsu, Kiritani, Hideki, Kawase, Yasuhiro, Ikemoto, Makoto, Yamazaki, Masanori, Sugiyama, Masaya, Mizutani, Fumikazu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2014
Language:
english
DOI:
10.1109/semi-therm.2014.6892243
File:
PDF, 342 KB
english, 2014
Conversion to is in progress
Conversion to is failed