Leakage and process variation effects in current testing on...

IEEE Design & Test of Computers 2002 / 09 Vol. 19; Iss. 5

Leakage and process variation effects in current testing on future CMOS circuits

Keshavarzi, A., Tschanz, J.W., Narendra, S., De, V., Daasch, W.R., Roy, K., Sachdev, M., Hawkins, C.F.
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Volume:
19
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.2002.1033790
Date:
September, 2002
File:
PDF, 1.13 MB
english, 2002
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