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A comparison of elemental analysis techniques requiring no sample preparation: scanning electron microscopy and laser induced breakdown spectroscopy
Heuser, Darryl, Walker, Dwight S.Volume:
19
Year:
2004
Language:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/b400801d
File:
PDF, 308 KB
english, 2004