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[IEEE Electrical Contacts - 2006. 52nd IEEE Holm Conference on Electrical Contacts - Montreal, QC, Canada (2006.09.25-2006.09.27)] Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts - Microstructure Analysis and the Effect of Cr Additive on Electrical Performance of (Cp-Nb)/Cu-Cd Electrical Contact Materials
Cui, Y.s., Wang, Y., Shao, W.z., Zhen, L., Ivanov, V.Year:
2006
Language:
english
DOI:
10.1109/holm.2006.284077
File:
PDF, 8.11 MB
english, 2006