[IEEE 2006 International Conference on Advanced Semiconductor Devices and Microsystems - Smolenice, Slovakia (2006.10.16-2006.10.18)] 2006 International Conference on Advanced Semiconductor Devices and Microsystems - Changes of GaAs neutron detectors properties after fast neutron irradiation
Ladziansky, Milan, Sagatova-Per'ochova, Andrea, Zat'ko, Bohumir, Necas, Vladimir, Dubecky, FrantisekYear:
2006
Language:
english
DOI:
10.1109/asdam.2006.331193
File:
PDF, 3.41 MB
english, 2006