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Direct nonlinear FET parameter extraction using large-signal waveform measurements
Werthorf, A., van Raay, F., Kompa, G.Volume:
3
Language:
english
Journal:
IEEE Microwave and Guided Wave Letters
DOI:
10.1109/75.217205
Date:
May, 1993
File:
PDF, 270 KB
english, 1993