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[IEEE 2013 14th International Conference on Ultimate Integration on Silicon (ULIS 2013) - Coventry (2013.3.19-2013.3.21)] 2013 14th International Conference on Ultimate Integration on Silicon (ULIS) - Model for investigation of Ion/Ioff ratios in short-channel junctionless double gate MOSFETs
Holtij, T., Schwarz, M., Graef, M., Hain, F., Kloes, A., Iniguez, B.Year:
2013
Language:
english
DOI:
10.1109/ulis.2013.6523497
File:
PDF, 795 KB
english, 2013