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[IEEE Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium - San Francisco, CA, USA (16-18 Sept. 1991)] [1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium - A statistical method to integrate manufacturing tolerance in high-speed digital circuit design
Goel, N., Kalaichelvan, K.S., Bleuer, B.Year:
1991
Language:
english
DOI:
10.1109/iemt.1991.279823
File:
PDF, 481 KB
english, 1991