[IEEE 2005 IEEE Conference on Electron Devices and...

  • Main
  • [IEEE 2005 IEEE Conference on Electron...

[IEEE 2005 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong (19-21 Dec. 2005)] 2005 IEEE Conference on Electron Devices and Solid-State Circuits - A Holistic Model for Mobility Enhancement through Process-Induced Stress

Mohan V. Dunga, Xuemei Xi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2005
Language:
english
DOI:
10.1109/edssc.2005.1635201
File:
PDF, 2.90 MB
english, 2005
Conversion to is in progress
Conversion to is failed