[IEEE Comput. Soc 8th IEEE European Test Workshop (ETW 03) - Maastricht, Netherlands (25-28 May 2003)] The Eighth IEEE European Test Workshop, 2003. Proceedings. - A practical evaluation of I/sub DDQ/ test strategies for deep submicron production test application. Experiences and targets from the field
Fudoli, A., Ascagni, A., Appello, D., Manhaeve, H.Year:
2003
DOI:
10.1109/etw.2003.1231670
File:
PDF, 611 KB
2003