[IEEE 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012 - Pittsburgh, PA, USA (2012.08.6-2012.08.10)] 2012 IEEE International Symposium on Electromagnetic Compatibility - Fast admittance computation for TSV arrays
Liu, Dazhao, Pan, Siming, Achkir, Brice, Fan, JunYear:
2012
Language:
english
DOI:
10.1109/isemc.2012.6351755
File:
PDF, 797 KB
english, 2012