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[IEEE 1998 IEEE International Frequency Control Symposium (Cat. No.98CH36165) - Pasadena, CA, USA (27-29 May 1998)] Proceedings of the 1998 IEEE International Frequency Control Symposium (Cat. No.98CH36165) - X-ray diffraction topography analysis of TS-TT vibrations in contoured AT-cut quartz resonators
Slavov, S.Year:
1998
Language:
english
DOI:
10.1109/freq.1998.717997
File:
PDF, 544 KB
english, 1998