TLP measurements for verification of ESD protection device...

IEEE Transactions on Electronics Packaging Manufacturing 2001 / 04 Vol. 24; Iss. 2

TLP measurements for verification of ESD protection device response

Hyatt, H., Harris, J., Alonzo, A., Bellew, P.
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Volume:
24
Language:
english
Journal:
IEEE Transactions on Electronics Packaging Manufacturing
DOI:
10.1109/6104.930959
Date:
April, 2001
File:
PDF, 192 KB
english, 2001
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