[IEEE 2006 International Biennial Baltic Electronics...

  • Main
  • [IEEE 2006 International Biennial...

[IEEE 2006 International Biennial Baltic Electronics Conference - Tallinn, Estonia (2006.10.2-2006.10.4)] 2006 International Biennial Baltic Electronics Conference - Self-Testing Checker Design for arbitrary number of code words of (m,n) code

Burkatovskaya, Yu., Butorina, N., Matrosova, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
DOI:
10.1109/bec.2006.311093
File:
PDF, 201 KB
2006
Conversion to is in progress
Conversion to is failed